Comparison of cell encapsulation technologies for single pressure vessel nickel-hydrogen battery

Author

Rao, Gopalakrishna ; Vaidyanathan, Hari

Author_Institution

NASA Goddard Space Flight Center, Greenbelt, MD, USA

Volume

1

fYear

1996

fDate

11-16 Aug 1996

Firstpage

384

Abstract

Two single pressure vessel (SPV) batteries containing 22 series-connected nickel-hydrogen (Ni-H₂) cells of 19-Ah capacity were designed and procured from Eagle-Picher Industries. The two batteries were similar in mechanical design, dimensions, and composition of the active core. However, they differed in cell encapsulation, location and structure of the gas diffusion membrane, and cell activation. Both batteries have been subjected to detailed flight qualification testing at COMSAT Laboratories. The batteries met the requirements in capacity, capacity retention, discharge voltage, impedance, thermal behavior in vacuum, and response to vibration. The batteries are currently being cycle tested in a low earth orbit (LEG) regime using V-T charge control at a depth of discharge of 40 percent and at 20°C. The battery design, and its characterization, environmental, and LEO cycle test data are presented herein

Keywords

electric impedance; encapsulation; hydrogen; nickel; secondary cells; space vehicle power plants; testing; 20 C; COMSAT Laboratories; Eagle-Picher Industries; Ni-H₂; Ni-H₂ cells; V-T charge control; battery design; capacity retention; cell activation; cell encapsulation technologies; depth of discharge; discharge voltage; flight qualification testing; gas diffusion membrane; impedance; low Earth orbit; mechanical design; single pressure vessel nickel-hydrogen battery; thermal behavior; vibration response; Batteries; Biomembranes; Encapsulation; Fault location; Impedance; Laboratories; Low earth orbit satellites; Qualifications; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Energy Conversion Engineering Conference, 1996. IECEC 96., Proceedings of the 31st Intersociety

Conference_Location

Washington, DC

ISSN

1089-3547

Print_ISBN

0-7803-3547-3

Type

conf

DOI

10.1109/IECEC.1996.552912

Filename

552912