Title :
Indirect field oriented control of induction motors is robustly globally stable
Author :
De Wit, Paul ; Ortega, Romeo ; Mareels, Iven
Author_Institution :
Fac. of Mech. Eng., Twente Univ., Enschede, Netherlands
Abstract :
For induction motors indirect field oriented control is a simple and highly reliable scheme which has become an industry standard. We have previously shown that, in speed regulation tasks with constant load torque and current fed machines, indirect field oriented control is globally asymptotically stable provided the motor rotor resistance is exactly known. It is well known that this parameter is subject to significant changes during the machine operation, hence the question of the robustness of this stability result remained to be established. In this paper we provide some answers to this question. First, we give necessary and sufficient conditions for uniqueness of the equilibrium point of the (nonlinear) closed loop, which interestingly enough allow for a 200% error in the rotor resistance estimate. Then, we give conditions on the motor and controller parameters, and the speed and rotor flux norm reference values that insure either global boundedness of all solutions, or (global or local) asymptotic stability or instability of the equilibrium. The analysis is carried out using classical Lyapunov stability theory and some basic input-output theory
Keywords :
Lyapunov methods; angular velocity control; asymptotic stability; feedback; induction motors; machine control; robust control; rotors; stators; Lyapunov stability; closed loop control; global asymptotic stability; indirect field oriented control; induction motors; input-output theory; necessary conditions; robustness; rotor flux; rotor resistance; sufficient condition; velocity control; Induction motors; Mechanical engineering; Reliability engineering; Robust control; Robust stability; Rotors; Stability analysis; Stators; Systems engineering and theory; Torque control;
Conference_Titel :
Decision and Control, 1995., Proceedings of the 34th IEEE Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-2685-7
DOI :
10.1109/CDC.1995.480518