DocumentCode :
3041901
Title :
Memory Technologies for Neural Networks
Author :
Merrikh-Bayat, F. ; Prezioso, M. ; Guo, X. ; Hoskins, B. ; Strukov, D.B. ; Likharev, K.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., UCSB Santa Barbara, Santa Barbara, CA, USA
fYear :
2015
fDate :
17-20 May 2015
Firstpage :
1
Lastpage :
4
Abstract :
Synapses, the most numerous elements of neural networks, are memory devices. Similarly to traditional memory applications, device density is one of the most essential metrics for large-scale artificial neural networks. This application, however, imposes a number of additional requirements, such as the continuous change of the memory state, so that novel engineering approaches are required. In this paper, we briefly review our recent efforts at addressing these needs. We start by reviewing the CrossNet concept, which was conceived to address major challenges of artificial neural networks. We then discuss the recent progress toward CrossNet implementation, in particular the experimental results for simple networks with crossbar-integrated resistive switching (memristive) metal oxide devices. Finally, we review preliminary results on redesigning commercial-grade embedded NOR flash memories to enable individual cell tuning. While NOR flash memories are less dense then memristor crossbars, their technology is much more mature and ready for the development of large-scale neural networks.
Keywords :
NOR circuits; flash memories; memristor circuits; neural chips; CrossNet concept; cell tuning; commercial-grade embedded NOR flash memory; crossbar-integrated resistive switching metal oxide devices; device density; engineering approach; large-scale artificial neural networks; memory devices; memory technology; memristive metal oxide devices; memristor crossbars; synapses; Arrays; CMOS integrated circuits; Memristors; Microprocessors; Neurons; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Workshop (IMW), 2015 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-6931-2
Type :
conf
DOI :
10.1109/IMW.2015.7150295
Filename :
7150295
Link To Document :
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