DocumentCode :
3041967
Title :
High performance BiCMOS technology design for sub-10 ns 4 Mbit BiCMOS SRAM with 3.3 V operation
Author :
Maeda, T. ; Gojohbori ; Inoue, K. ; Ishimaru, K. ; Suzuki, A. ; Kato, H. ; Kakumu, M.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
fYear :
1992
fDate :
2-4 June 1992
Firstpage :
32
Lastpage :
33
Abstract :
A high-performance 0.5- mu m BiCMOS technology for 4-Mb BiCMOS SRAM for low-voltage operation is discussed. 1.5* performance improvement and low power relative to 0.8- mu m BiCMOS technology are achieved with reduced operation of 3.3 V. In particular, although power-supply voltage is reduced, none of device performance is so severe as to constrain the feasibility of a 0.5- mu m and below BiCMOS technology even for a high-density 4-Mb SRAM. A 16-b 4-Mb BiCMOS SRAM was fabricated to prove the developed 0.5- mu m BiCMOS technology combined with a quadruple poly Si and double Al process. The cell size is 3.5 mu m*5.7 mu m, and the chip size is 8.7mm*18.8 mm. Parametric testing of the 4-Mb BiCMOS SRAM confirmed the expected 9-ns access time at 3.3-V operation. Moreover, the total power dissipation can be managed below 500 mW, which is available for plastic packaging.<>
Keywords :
BiCMOS integrated circuits; SRAM chips; VLSI; integrated circuit technology; 0.5 micron; 16 bit; 18.8 mm; 3.3 V; 3.5 micron; 4 Mbit; 5.7 micron; 500 mW; 8.7 mm; 9 ns; BiCMOS technology; SRAM; VLSI; access time; cell size; chip size; low-voltage operation; performance improvement; plastic packaging; power dissipation; BiCMOS integrated circuits; Bipolar transistors; CMOS technology; Low voltage; MOS devices; MOSFET circuits; Parasitic capacitance; Power MOSFET; Random access memory; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1992. Digest of Technical Papers. 1992 Symposium on
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-0698-8
Type :
conf
DOI :
10.1109/VLSIT.1992.200632
Filename :
200632
Link To Document :
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