Title :
Structural and Optical Characterisation of
Author :
Hatch, S.D. ; Becker, C.R. ; Saunders, M. ; Sewell, R.H. ; Dieing, T. ; Dell, J.M. ; Stamps, R.L.
Author_Institution :
Sch. of Electr., Electron. & Comput. Eng., Western Australia Univ, Crawley, WA
Abstract :
A number of (001) HgTe-CdTe super-lattices grown by molecular beam epitaxy have been studied via structural and optical characterisation techniques. Transmission electron microscopy and X-ray diffraction were used to determine the layer thicknesses and indicated the growths were of high quality. Room temperature transmission measurements were performed and from them absorption spectra produced which revealed the first two optical transitions, El-Hl and El-Ll. The absorption spectra showed good correlation to theoretical calculations based on a four band kmiddotp model. Strong room temperature infrared photoluminescence associated with the El-Hl transit ion was also observed in these superlattices
Keywords :
II-VI semiconductors; X-ray diffraction; cadmium compounds; k.p calculations; mercury compounds; molecular beam epitaxial growth; optical films; photoluminescence; semiconductor growth; semiconductor superlattices; semiconductor thin films; transmission electron microscopy; HgTe-Hg1-xCdxTe superlattices; X-ray diffraction; absorption spectra; infrared photoluminescence; kmiddotp model; layer thickness; molecular beam epitaxy; transmission electron microscopy; Electromagnetic wave absorption; Electron optics; Molecular beam epitaxial growth; Optical diffraction; Optical superlattices; Particle beam optics; Performance evaluation; Temperature measurement; Transmission electron microscopy; X-ray diffraction;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2004 Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-8820-8
DOI :
10.1109/COMMAD.2004.1577493
