Title :
Quantitative data for design models
Author :
Lawson, J. Ronald
Author_Institution :
Government & Syst. Technol. Group, Motorola Inc., Scottsdale, AZ, USA
Abstract :
New product development has the objective of meeting customer requirements and being producible. In order to have a design meet these objectives, the concurrent engineering team must use metrics to manage the design process from concept to production. In some cases the chosen metrics use concepts that are not always intuitive for the engineers on the team. Also they are not sure where to get the data that is necessary to make a good estimate of the metric. In many cases they have been trained in the arithmetic for computing the mean, standard deviation, and variance, but when it comes to making predictions of these, there is sometimes confusion. This paper will discuss a design process that focuses on critical product requirements, for which statistical values are assigned to each parameter in order to be aware of the target and the variation to be expected. Sources of data will be discussed that can make this design modeling exercise meaningful. The purpose of this work was to better identify the methods to be used in the design concept stage for evaluating the capability of a product to meet its quantitative performance and producibility requirements
Keywords :
product development; quality control; statistical analysis; concurrent engineering team; critical product requirements; customer requirements; design concept stage; design modeling exercise; design process; metrics; new product development; producibility requirements; quantitative performance; statistical values; Arithmetic; Concurrent engineering; Engineering management; Government; Manufacturing industries; Process design; Product design; Product development; Production; Robustness;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1994. Low-Cost Manufacturing Technologies for Tomorrow's Global Economy. Proceedings 1994 IEMT Symposium., Sixteenth IEEE/CPMT International
Conference_Location :
La Jolla, CA
Print_ISBN :
0-7803-2037-9
DOI :
10.1109/IEMT.1994.404709