• DocumentCode
    3042119
  • Title

    Low temperature cofired ceramics (LTCC)-based miniaturized load cells

  • Author

    Lenz, Christian ; Ziesche, Steffen ; Partsch, Uwe ; Neubert, Holger

  • Author_Institution
    Hybrid Microsyst., Fraunhofer Inst. for Ceramic Technol. & Syst., Dresden, Germany
  • fYear
    2012
  • fDate
    9-13 May 2012
  • Firstpage
    406
  • Lastpage
    411
  • Abstract
    This work presents miniaturized piezoresistive load cells in LTCC for low force ranges. Compared to former investigations on this area we designed the load cells according to commercial products. We used a freestanding cartwheel structure with co-fired piezoresistive resistors as deformable bodies which combines both: high sensitivity and a high robustness against shear forces. The designed packaging allows the sensing of compressive and tensile forces for different ranges (2 N, 5 N and 10 N) and is characterized by a high miniaturization. We developed an analytical model to design the cartwheel structures and to predict the expected characteristics. To increase the repeatability and the reliability we studied different fabrication techniques to reduce cracks, delaminations and sagging. The sensor elements were fabricated in the standard LTCC-technology on GT 951. The fabricated load cells were characterized between 25 °C and 80 °C regarding relevant parameters. The results show a good match to the theoretically calculated values.
  • Keywords
    ceramic packaging; cracks; delamination; piezoresistive devices; reliability; resistors; sensitivity; LTCC; cartwheel structures; cofired piezoresistive resistors; commercial products; compressive forces; crack reduction; delamination reduction; fabrication techniques; freestanding cartwheel structure; high robustness; high sensitivity; low force ranges; low temperature cofired ceramics; miniaturized load cells; packaging; reliability; sagging reduction; shear forces; temperature 25 degC to 80 degC; tensile forces; Fabrication; Force; Piezoresistance; Resistors; Sensitivity; Stress; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2012 35th International Spring Seminar on
  • Conference_Location
    Bad Aussee
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4673-2241-6
  • Electronic_ISBN
    2161-2528
  • Type

    conf

  • DOI
    10.1109/ISSE.2012.6273170
  • Filename
    6273170