Title :
Contiunous Micro-Particle Separation using Optically-Induced Dielectrophoretic Forces
Author :
Lin, Wang-Ying ; Lin, Yen-Heng ; Lee, Gwo-Bin
Author_Institution :
Dept. of Eng. Sci., Nat. Cheng Kung Univ., Tainan
Abstract :
The current study presents new methods to quickly separate micro-particles with different sizes using optically-induced dielectrophoretic (ODEP) forces. It was found that the strength of the ODEP force induced on the hydrogenated amorphous silicon surface is determined by the wavelength of the illuminating patterns. Therefore two moving lines and one stationary illuminated line which produced the ODEP forces as virtual electrodes were first defined by projecting lights onto a photoconductive chip. The moving lines and one stationary illuminated line were used to generate a stronger and a weaker ODEP force, respectively. As the moving lines approached to the weaker line, micro-particles between them were concentrated by the higher ODEP forces and squeezed through the stationary electrode. Finally, lager micro-particles were subsequently separated from the smaller particles. With this approach, continuous particle separation can be automatically achieved in a short period of time. This developed method may be promising for a variety of applications such as cell-based assays and sample pre-treatment using micro-particles.
Keywords :
electrophoresis; elemental semiconductors; hydrogen; photoconducting devices; silicon; Si:H; cell-based assays; hydrogenated amorphous silicon surface; microparticle separation; optically-induced dielectrophoretic forces; photoconductive chip; stationary electrode; stationary illuminated line; virtual electrodes; Amorphous silicon; Biomedical optical imaging; Dielectrics; Dielectrophoresis; Electrodes; Glass; Indium tin oxide; Optical devices; Optical surface waves; Surface waves;
Conference_Titel :
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4244-2977-6
Electronic_ISBN :
1084-6999
DOI :
10.1109/MEMSYS.2009.4805315