• DocumentCode
    3042315
  • Title

    Guidelines for statistically based sampling reduction

  • Author

    Pepper, Dwayne

  • Author_Institution
    Sematech, Austin, TX, USA
  • fYear
    1994
  • fDate
    12-14 Sep 1994
  • Firstpage
    216
  • Abstract
    Presented are general guidelines, with examples, for sample reduction and monitor elimination in a high-volume manufacturing environment. Although statistical soundness is never overlooked, this focus on sampling is from a practical point of view. That is, can we have this level of sampling indefinitely and still run a profitable operation? Examples are taken from a factory where comprehensive sample reduction has led to substantial cost savings
  • Keywords
    batch processing (industrial); economics; statistical analysis; cost savings; factory; high-volume manufacturing environment; monitor elimination; profitable operation; statistically based sampling reduction; Condition monitoring; Cost benefit analysis; Electronics industry; Extrapolation; Fabrication; Guidelines; Manufacturing; Metrology; Production facilities; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1994. Low-Cost Manufacturing Technologies for Tomorrow's Global Economy. Proceedings 1994 IEMT Symposium., Sixteenth IEEE/CPMT International
  • Conference_Location
    La Jolla, CA
  • Print_ISBN
    0-7803-2037-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1994.404710
  • Filename
    404710