DocumentCode
3042315
Title
Guidelines for statistically based sampling reduction
Author
Pepper, Dwayne
Author_Institution
Sematech, Austin, TX, USA
fYear
1994
fDate
12-14 Sep 1994
Firstpage
216
Abstract
Presented are general guidelines, with examples, for sample reduction and monitor elimination in a high-volume manufacturing environment. Although statistical soundness is never overlooked, this focus on sampling is from a practical point of view. That is, can we have this level of sampling indefinitely and still run a profitable operation? Examples are taken from a factory where comprehensive sample reduction has led to substantial cost savings
Keywords
batch processing (industrial); economics; statistical analysis; cost savings; factory; high-volume manufacturing environment; monitor elimination; profitable operation; statistically based sampling reduction; Condition monitoring; Cost benefit analysis; Electronics industry; Extrapolation; Fabrication; Guidelines; Manufacturing; Metrology; Production facilities; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1994. Low-Cost Manufacturing Technologies for Tomorrow's Global Economy. Proceedings 1994 IEMT Symposium., Sixteenth IEEE/CPMT International
Conference_Location
La Jolla, CA
Print_ISBN
0-7803-2037-9
Type
conf
DOI
10.1109/IEMT.1994.404710
Filename
404710
Link To Document