• DocumentCode
    3042751
  • Title

    Femtosecond Multidimensional Spectroscopy to Study Carrier Dynamics of Photonic Materials

  • Author

    Lap Van Dao ; My Thi Tra Do ; Eckle, P. ; Hannaford, P. ; Reece, P. ; Aizengendler, M. ; Stanco, A.

  • Author_Institution
    Centre for Atom Opt. & Ultrafast Spectrosc., Swinburne Univ. of Technol., Melbourne, Vic.
  • fYear
    2004
  • fDate
    8-10 Dec. 2004
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    Multidimensional nonlinear coherence spectroscopy based on spectrally resolved femtosecond 2-colour 3-pulse photon echo measurements has been used to investigate the carrier dynamics and energy structure of porous silicon an - indirect band gap material. Short times are found for electron localization (∼ 500 fs) and electron hopping (∼ 3 ps), which are dependent on the porosity of the sample. A spin-orbit energy splitting for the conduction and valence band can be deduced
  • Keywords
    conduction bands; high-speed optical techniques; light coherence; photon echo; photonic band gap; porosity; valence bands; 2-colour photon echo measurements; 3 ps; 3-pulse photon echo measurements; 500 fs; carrier dynamics; conduction band; electron hopping; electron localization; energy structure; femtosecond measurements; femtosecond spectroscopy; indirect band gap material; multidimensional spectroscopy; nonlinear coherence spectroscopy; photonic materials; porosity; porous silicon; spectrally resolved measurements; spin-orbit energy splitting; valence band; Australia; Charge carrier processes; Energy resolution; Multidimensional systems; Optical materials; Photonic band gap; Quantum dot lasers; Silicon; Spectroscopy; Ultrafast optics; Photon echo; laser spectroscopy; optical propertiesof low-dimensional structures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials and Devices, 2004 Conference on
  • Conference_Location
    Brisbane, Qld.
  • Print_ISBN
    0-7803-8820-8
  • Type

    conf

  • DOI
    10.1109/COMMAD.2004.1577536
  • Filename
    1577536