Title :
Fault coverage improvement based on error signal analysis
Author :
Wong, Mike W T ; Zhou, Yingquan ; Lee, Y.S. ; Min, Yinghua
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Abstract :
Fault-tolerant design of analog circuits is more difficult than that of digital circuits. Chatterjee (1993) has proposed a continuous checksum-based technique to design fault-tolerant linear analog circuits. However, some faults in the passive elements cannot be detected if the checker has not been designed appropriately. This paper addresses the fault coverage issue in the continuous checksum based technique and proposes an error signal analysis based method for improving fault coverage of the checker
Keywords :
active filters; analogue circuits; error detection; linear network analysis; low-pass filters; performance index; signal processing; active low-pass filter; checker; continuous checksum based technique; error signal analysis; fault coverage; fault-tolerant design; linear analog circuits; passive elements; Analog circuits; Analog computers; Circuit faults; Circuit testing; Design engineering; Electrical fault detection; Error correction; Fault detection; Fault tolerance; Signal analysis;
Conference_Titel :
Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific
Conference_Location :
Chiba
Print_ISBN :
0-7803-3662-3
DOI :
10.1109/ASPDAC.1997.600274
