• DocumentCode
    3043599
  • Title

    A resistance deviation-to-time interval converter for resistive sensors

  • Author

    Park, Ji-Man ; Jun, Sung-Ik

  • Author_Institution
    Wireless Security Applic. Res. Team, ETRI, Daejeon
  • fYear
    2008
  • fDate
    17-20 Sept. 2008
  • Firstpage
    101
  • Lastpage
    104
  • Abstract
    A resistance deviation-to-time interval converter is presented for interfacing resistive sensors. It consists of two voltage-sources, a ramp integrator, a pair of comparator, and two logic gates. The proposed converter was designed and built on 0.35 mum CMOS process. The prototype circuit exhibits a resolution as high as 13 bits, a linearity error less than plusmn 0.1%, and environment-independent signal stability, when the output pulse is counted by 20 MHz clock signal. Moreover, the circuit complexity becomes quite simple and can be implemented in a very small space. One possible application of the proposed converter is found in a system based on any resistive-sensor like a physical contact or temperature sensor.
  • Keywords
    CMOS integrated circuits; comparators (circuits); convertors; CMOS process; comparator; frequency 20 MHz; logic gates; resistance deviation-to-time interval converter; resistive sensors; size 0.35 mum; temperature sensor; voltage-source ramp integrator; CMOS logic circuits; CMOS process; Circuit stability; Clocks; Linearity; Logic gates; Prototypes; Pulse circuits; Signal resolution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2008 IEEE International
  • Conference_Location
    Newport Beach, CA
  • Print_ISBN
    978-1-4244-2596-9
  • Electronic_ISBN
    978-1-4244-2597-6
  • Type

    conf

  • DOI
    10.1109/SOCC.2008.4641488
  • Filename
    4641488