DocumentCode :
3043599
Title :
A resistance deviation-to-time interval converter for resistive sensors
Author :
Park, Ji-Man ; Jun, Sung-Ik
Author_Institution :
Wireless Security Applic. Res. Team, ETRI, Daejeon
fYear :
2008
fDate :
17-20 Sept. 2008
Firstpage :
101
Lastpage :
104
Abstract :
A resistance deviation-to-time interval converter is presented for interfacing resistive sensors. It consists of two voltage-sources, a ramp integrator, a pair of comparator, and two logic gates. The proposed converter was designed and built on 0.35 mum CMOS process. The prototype circuit exhibits a resolution as high as 13 bits, a linearity error less than plusmn 0.1%, and environment-independent signal stability, when the output pulse is counted by 20 MHz clock signal. Moreover, the circuit complexity becomes quite simple and can be implemented in a very small space. One possible application of the proposed converter is found in a system based on any resistive-sensor like a physical contact or temperature sensor.
Keywords :
CMOS integrated circuits; comparators (circuits); convertors; CMOS process; comparator; frequency 20 MHz; logic gates; resistance deviation-to-time interval converter; resistive sensors; size 0.35 mum; temperature sensor; voltage-source ramp integrator; CMOS logic circuits; CMOS process; Circuit stability; Clocks; Linearity; Logic gates; Prototypes; Pulse circuits; Signal resolution; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2008 IEEE International
Conference_Location :
Newport Beach, CA
Print_ISBN :
978-1-4244-2596-9
Electronic_ISBN :
978-1-4244-2597-6
Type :
conf
DOI :
10.1109/SOCC.2008.4641488
Filename :
4641488
Link To Document :
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