DocumentCode :
3043817
Title :
A 0.35 V, 100 MHz, 0.19 μW/MHz, 3-locking-cycle all digital delay locked loop with asynchronous-deskewing technology in 55 nm CMOS technology
Author :
Cheng, Chun-Yuan ; Wang, Jinn-Shyan ; Yeh, Cheng-Tai
Author_Institution :
Dept. of Electr. Eng., Nat. Chung-Cheng Univ., Chiayi, Taiwan
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
19
Lastpage :
24
Abstract :
This paper presents an all digital delay-locked loop (ADDLL) that uses asynchronous-deskewing technology and achieves low power/voltage, small jitter, fast locking, and high process, voltage, and temperature (PVT)-variation tolerance. The measurement results show that the maximum frequency is 100 MHz at 0.35 V with 19μW power dissipation, 62 ps peak-to-peak jitter, and 3 locking cycles. When operated at 0.5 V, the measured maximal operating clock frequency is 450 MHz with 12 ps peak-to-peak jitter, 6 locking cycles, and 119μW power dissipation. The ADDLL is fabricated with 55nm CMOS technology, and the active area is only 0.019 mm2.
Keywords :
CMOS integrated circuits; delay lock loops; 3-locking-cycle all digital delay locked loop; CMOS technology; asynchronous-deskewing technology; frequency 100 MHz; power 119 muW; power 19 muW; size 55 nm; time 12 ps; time 62 ps; voltage 0.35 V; voltage 0.5 V; Clocks; Computer architecture; Delay; Delay lines; Detectors; Jitter; Radiation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
Type :
conf
DOI :
10.1109/ISICir.2011.6131870
Filename :
6131870
Link To Document :
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