DocumentCode :
3044353
Title :
A novel control chart employing curtailed inspection
Author :
Liu, Qingchuan ; Wu, Zhang ; Xie, Ming ; Zhang, Yu
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
893
Abstract :
This article presents an optimal algorithm for the design of the SX (sum of Xs) control chart. The objective is to maximize the effectiveness of the SX control chart in detecting the process mean shifts, on condition that the false alarm rate is held at a specified level. The optimal SX chart can be used in 100% inspection, and in some sampling inspections as well. The effectiveness of the SX chart is measured by the out-of-control average time to signal (ATS) under the random-shift mode. The effectiveness of the optimal SX chart is further enhanced by the curtail technique. The results from many numerical studies have shown that the optimal SX chart with curtailment is able to reduce the out-of-control ATS by half, on average, compared to the conventional Shewhart X¯ chart. It even outperforms the EWMA chart and the joint X¯-EWMA chart for mean shift δ of any sizes
Keywords :
inspection; statistical process control; SX control chart; control chart; curtailed inspection; false alarm rate; mean shift δ; optimal algorithm; out-of-control average time to signal; process mean shifts detection; random-shift mode; sum of Xs control chart; Algorithm design and analysis; Control charts; Degradation; Industrial control; Inspection; Large-scale systems; Monitoring; Production engineering; Signal sampling; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on
Print_ISBN :
0-7803-6652-2
Type :
conf
DOI :
10.1109/ICMIT.2000.916824
Filename :
916824
Link To Document :
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