• DocumentCode
    3044353
  • Title

    A novel control chart employing curtailed inspection

  • Author

    Liu, Qingchuan ; Wu, Zhang ; Xie, Ming ; Zhang, Yu

  • Author_Institution
    Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    893
  • Abstract
    This article presents an optimal algorithm for the design of the SX (sum of Xs) control chart. The objective is to maximize the effectiveness of the SX control chart in detecting the process mean shifts, on condition that the false alarm rate is held at a specified level. The optimal SX chart can be used in 100% inspection, and in some sampling inspections as well. The effectiveness of the SX chart is measured by the out-of-control average time to signal (ATS) under the random-shift mode. The effectiveness of the optimal SX chart is further enhanced by the curtail technique. The results from many numerical studies have shown that the optimal SX chart with curtailment is able to reduce the out-of-control ATS by half, on average, compared to the conventional Shewhart X¯ chart. It even outperforms the EWMA chart and the joint X¯-EWMA chart for mean shift δ of any sizes
  • Keywords
    inspection; statistical process control; SX control chart; control chart; curtailed inspection; false alarm rate; mean shift δ; optimal algorithm; out-of-control average time to signal; process mean shifts detection; random-shift mode; sum of Xs control chart; Algorithm design and analysis; Control charts; Degradation; Industrial control; Inspection; Large-scale systems; Monitoring; Production engineering; Signal sampling; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on
  • Print_ISBN
    0-7803-6652-2
  • Type

    conf

  • DOI
    10.1109/ICMIT.2000.916824
  • Filename
    916824