• DocumentCode
    3044613
  • Title

    Material Issues In Epitaxy III-V Compound Semiconductors And Their Effects On Device Reliability

  • Author

    Chu, S.N.G.

  • Author_Institution
    AT&T Bell Laboratories
  • fYear
    1994
  • fDate
    6-13 Jul 1994
  • Keywords
    Diode lasers; Epitaxial growth; III-V semiconductor materials; Materials reliability; Optical materials; Optical microscopy; Optoelectronic devices; Semiconductor device reliability; Surface emitting lasers; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Optoelectronics, 1994., Proceedings of IEE/LEOS Summer Topical Meetings:
  • Print_ISBN
    0-7803-1752-1
  • Type

    conf

  • DOI
    10.1109/LEOSST.1994.700549
  • Filename
    700549
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3044613