DocumentCode :
3044613
Title :
Material Issues In Epitaxy III-V Compound Semiconductors And Their Effects On Device Reliability
Author :
Chu, S.N.G.
Author_Institution :
AT&T Bell Laboratories
fYear :
1994
fDate :
6-13 Jul 1994
Keywords :
Diode lasers; Epitaxial growth; III-V semiconductor materials; Materials reliability; Optical materials; Optical microscopy; Optoelectronic devices; Semiconductor device reliability; Surface emitting lasers; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Optoelectronics, 1994., Proceedings of IEE/LEOS Summer Topical Meetings:
Print_ISBN :
0-7803-1752-1
Type :
conf
DOI :
10.1109/LEOSST.1994.700549
Filename :
700549
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3044613
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