Title :
Correlation Of Epitaxial Layer Measurements With Device Performance : Practicalities
Author :
Hennessy, John ; Moore, C.J.
Author_Institution :
Waterloo Scientific Inc.
Keywords :
Composite materials; Costs; Degradation; Design for experiments; Economic forecasting; Epitaxial layers; Manufacturing; Optoelectronic devices; Process control; Testing;
Conference_Titel :
Integrated Optoelectronics, 1994., Proceedings of IEE/LEOS Summer Topical Meetings:
Print_ISBN :
0-7803-1752-1
DOI :
10.1109/LEOSST.1994.700555
