DocumentCode :
3045347
Title :
Design optimization of MOS operational amplifiers using finite difference sensitivity
Author :
Weng, Binbin ; Shi, Guoyong
Author_Institution :
Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
277
Lastpage :
280
Abstract :
MOS analog circuit sizing is considered a highly complex task that requires experience and skills. Many methods proposed in the literature have arguable merits and limitations; none of them has become a widely recognized method being adopted in the design practice. This paper attempts to use a simply computable metric called the finite difference sensitivity computed mainly in the ac domain for the purpose of device sizing. Multiple design goals are formulated as a weighted optimization objective function and a gradient search is developed for optimizing the objective function. All constraints are subsumed in the objective function in the form of penalty functions. Experimental results show that such a simple formulation of circuit optimization is capable of finding satisfactory suboptimal sizing results which can be used for subsequent manual tuning or layout reference. The automated sizing procedure is compared to manual sizing and is demonstrated that the auto-sizing scheme has a better capability in balancing the multiple design objectives.
Keywords :
MOS analogue integrated circuits; circuit optimisation; finite difference methods; gradient methods; integrated circuit design; operational amplifiers; MOS analog circuit sizing; MOS operational amplifiers; ac domain; automated sizing procedure; circuit optimization; design optimization; device sizing; finite difference sensitivity; gradient search; layout reference; manual sizing; manual tuning; penalty functions; satisfactory suboptimal sizing; weighted optimization objective function; Analog circuits; Design automation; MOSFET circuits; Manuals; Optimization; Sensitivity; MOS operational amplifier; analog design automation; finite-difference sensitivity; optimization; sizing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-61284-863-1
Type :
conf
DOI :
10.1109/ISICir.2011.6131950
Filename :
6131950
Link To Document :
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