DocumentCode
3045487
Title
Oblique fringe measurement by pattern correlation
Author
Liu, Lanjiao ; Pan, Haiyan ; Xu, Jia ; Xu, Hongmei ; Yue, Yong ; Li, Dayou ; Song, Zhengxun ; Weng, Zhankun ; Hu, Zhen ; Wang, Zuobin ; Zhang, Jin
Author_Institution
CNM & IJRCNB Centers, Changchun Univ. of Sci. & Technol., Changchun, China
fYear
2010
fDate
20-23 June 2010
Firstpage
940
Lastpage
945
Abstract
This paper introduces a method for the determination of the slope and period of oblique and equi-spaced fringes by pattern correlation. In the method, two pairs of image patches in two different regions of a fringe pattern are selected for pattern correlation calculations, and the phase shift between the two selected regions of the fringe pattern is obtained from the phase curves computed with the correlation function. The computer simulation and experiment have shown that this method is useful in interferometry and laser interference lithography for determining the slope and period of the oblique and equi-spaced fringe patterns with the advantage of high resistance to noise. It has potential applications for the measurement of the fringe pattern period, fringe angle, phase difference, displacement, and other relevant physical quantities. In practice, it can also be used for the orientation of interference patterns and alignment of laser interference lithography systems.
Keywords
angular measurement; correlation methods; displacement measurement; image processing; interferometry; phase measurement; computer simulation; displacement measurement; fringe angle measurement; fringe pattern period measurement; image patches; interference patterns; interferometry; laser interference lithography system; oblique fringe measurement; pattern correlation; period determination; phase difference measurement; phase shift; slope determination; Application software; Computer simulation; Displacement measurement; Electrical resistance measurement; Interference; Laser noise; Laser theory; Lithography; Phase measurement; Phase shifting interferometry; Oblique fringe; fringe measurement; interferometry; laser interference lithography; pattern correlation;
fLanguage
English
Publisher
ieee
Conference_Titel
Information and Automation (ICIA), 2010 IEEE International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4244-5701-4
Type
conf
DOI
10.1109/ICINFA.2010.5512137
Filename
5512137
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