• DocumentCode
    3045487
  • Title

    Oblique fringe measurement by pattern correlation

  • Author

    Liu, Lanjiao ; Pan, Haiyan ; Xu, Jia ; Xu, Hongmei ; Yue, Yong ; Li, Dayou ; Song, Zhengxun ; Weng, Zhankun ; Hu, Zhen ; Wang, Zuobin ; Zhang, Jin

  • Author_Institution
    CNM & IJRCNB Centers, Changchun Univ. of Sci. & Technol., Changchun, China
  • fYear
    2010
  • fDate
    20-23 June 2010
  • Firstpage
    940
  • Lastpage
    945
  • Abstract
    This paper introduces a method for the determination of the slope and period of oblique and equi-spaced fringes by pattern correlation. In the method, two pairs of image patches in two different regions of a fringe pattern are selected for pattern correlation calculations, and the phase shift between the two selected regions of the fringe pattern is obtained from the phase curves computed with the correlation function. The computer simulation and experiment have shown that this method is useful in interferometry and laser interference lithography for determining the slope and period of the oblique and equi-spaced fringe patterns with the advantage of high resistance to noise. It has potential applications for the measurement of the fringe pattern period, fringe angle, phase difference, displacement, and other relevant physical quantities. In practice, it can also be used for the orientation of interference patterns and alignment of laser interference lithography systems.
  • Keywords
    angular measurement; correlation methods; displacement measurement; image processing; interferometry; phase measurement; computer simulation; displacement measurement; fringe angle measurement; fringe pattern period measurement; image patches; interference patterns; interferometry; laser interference lithography system; oblique fringe measurement; pattern correlation; period determination; phase difference measurement; phase shift; slope determination; Application software; Computer simulation; Displacement measurement; Electrical resistance measurement; Interference; Laser noise; Laser theory; Lithography; Phase measurement; Phase shifting interferometry; Oblique fringe; fringe measurement; interferometry; laser interference lithography; pattern correlation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Automation (ICIA), 2010 IEEE International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-5701-4
  • Type

    conf

  • DOI
    10.1109/ICINFA.2010.5512137
  • Filename
    5512137