Title :
Wafer Scale Encapsulation of Large Lateral Deflection MEMS Structures
Author :
Graham, A.B. ; Messana, M. ; Hartwell, P. ; Provine, J. ; Yoneoka, S. ; Kim, B. ; Melamud, R. ; Howe, R.T. ; Kenny, T.W.
Author_Institution :
Stanford Univ., Stanford, CA
Abstract :
Packaging of microelectromechanical systems (MEMS) is a critical step in the transition from product development to production. This paper presents a robust, hermetically-sealed encapsulation method that can accommodate many traditional MEMS devices by allowing large lateral deflection structures within a clean environment. Using the new technology described in this paper, trench widths ranging from 1 mum to 100 mum were successfully encapsulated at the wafer level while maintaining devices as thick as 20 mum. Devices produced with this method have proven durable enough to withstand harsh post-processing such as dicing and wire bonding. Two different types of MEMS resonators are also discussed, demonstrating the use of both large and small trench widths within the encapsulation.
Keywords :
encapsulation; hermetic seals; lead bonding; micromechanical resonators; wafer level packaging; MEMS resonator; dicing; hermetic seal; lateral deflection structures; microelectromechanical systems; packaging; size 1 mum to 100 mum; wafer scale encapsulation; wire bonding; Encapsulation; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Packaging; Product development; Production systems; Robustness; Wafer bonding; Wire;
Conference_Titel :
Micro Electro Mechanical Systems, 2009. MEMS 2009. IEEE 22nd International Conference on
Conference_Location :
Sorrento
Print_ISBN :
978-1-4244-2977-6
Electronic_ISBN :
1084-6999
DOI :
10.1109/MEMSYS.2009.4805490