Title :
A global entropy criterion for focus tuning in exit wavefunction reconstruction in high resolution electron microscopy
Author :
Van Dyck, D. ; De Beeck, M. Op ; Tang, D. ; Jansen, J. ; Zandbergen, H.W.
Author_Institution :
Antwerp Univ., Belgium
Abstract :
Starting from the physical principles of the dynamical scattering of high energetic electrons in high resolution electron microscopy (HREM) a new criterion is proposed for the determination of the absolute focus of reconstructed exit wave functions
Keywords :
electron beam focusing; electron microscopy; entropy; image reconstruction; image resolution; tuning; wave functions; TiO2; absolute focus; dynamical scattering; focus tuning; global entropy criterion; high energetic electrons; high resolution electron microscopy; reconstructed exit wave functions; wave function reconstruction; Crystallization; Electron beams; Electron microscopy; Entropy; Focusing; Image reconstruction; Image retrieval; Pixel; Scattering; Testing;
Conference_Titel :
Image Processing, 1996. Proceedings., International Conference on
Conference_Location :
Lausanne
Print_ISBN :
0-7803-3259-8
DOI :
10.1109/ICIP.1996.559604
