DocumentCode
3045682
Title
Parallel background calibration with signal-shifted correlation for pipelined ADC
Author
Sun, Kexu ; Wang, Xuan ; HE, Lenian
Author_Institution
Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
fYear
2011
fDate
12-14 Dec. 2011
Firstpage
340
Lastpage
343
Abstract
Correlation-based background calibration methods have been used to correct capacitor mismatch and finite opamp open-loop gain errors of pipelined analog-to-digital converter (ADC). However, the correlation takes long time to converge. A novel parallel background calibration for a 14-bit 100Msps ADC with signal-shifted correction is proposed to overcome the above constraint by three means. First, a modified 1.5-bit stage is proposed in order to allow the injection of a large pseudorandom dither without missing code. Second, before correlating the signal, it is divided into 18 sub-ranges via some additional comparators and shifted for the purpose that the error in correlation converges fast. Finally, the front pipeline stages are calibrated simultaneously rather than stage by stage to reduce calibration tracking time constants. In the proposed background calibration, the capacitor mismatch and gain errors in the modified pipeline stage are measured and calibrated as one error. With calibration, the simulations show a signal-to-noise-and-distortion-ratio performance of 77.1 dB and a spurious-free dynamic range performance of 98.2 dB.
Keywords
analogue-digital conversion; calibration; capacitors; comparators (circuits); correlation methods; operational amplifiers; calibration tracking time constant reduction; capacitor mismatch correction; comparators; correlation-based background calibration methods; finite opamp open-loop gain errors; large pseudorandom dither; parallel background calibration; pipelined ADC; pipelined analog-to-digital converter; signal-shifted correlation correction; signal-to-noise-and-distortion-ratio performance; spurious-free dynamic range performance; word length 1.5 bit; word length 14 bit; Calibration; Capacitors; Correlation; Measurement uncertainty; Noise; Pipelines; Time measurement; Background calibration; capacitor mismatch and gain calibration; digital calibration; pipelined analog-to-digital converter; signal-shifted correlation;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits (ISIC), 2011 13th International Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-61284-863-1
Type
conf
DOI
10.1109/ISICir.2011.6131966
Filename
6131966
Link To Document