Title :
Seu And Latch-up Results For Sparc Processors
Author :
Estreme, F. ; Chapuis, T. ; Velazco, R. ; Karoui, S. ; Trigaux, R. ; Benezech, D. ; Rosier, L.H.
Author_Institution :
Centre National d´´Etudes Spatiales
Keywords :
Circuit testing; Collaboration; Integrated circuit testing; Large scale integration; Microprocessors; Read-write memory; Registers; Single event upset; System testing; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700562
