• DocumentCode
    3045868
  • Title

    Seu And Latch-up Results For Sparc Processors

  • Author

    Estreme, F. ; Chapuis, T. ; Velazco, R. ; Karoui, S. ; Trigaux, R. ; Benezech, D. ; Rosier, L.H.

  • Author_Institution
    Centre National d´´Etudes Spatiales
  • fYear
    1993
  • fDate
    34171
  • Firstpage
    13
  • Lastpage
    19
  • Keywords
    Circuit testing; Collaboration; Integrated circuit testing; Large scale integration; Microprocessors; Read-write memory; Registers; Single event upset; System testing; Test facilities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1993., IEEE
  • Print_ISBN
    0-7803-1906-0
  • Type

    conf

  • DOI
    10.1109/REDW.1993.700562
  • Filename
    700562
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3045868