Title :
ISFET´s threshold voltage control using bidirectional electron tunnelling
Author :
Al-Ahdal, Abdulrahman ; Georgiou, Pantelis ; Toumazou, Christofer
Author_Institution :
Electr. Eng. Dept., Umm Al-Qura Univ., Makkah, Saudi Arabia
Abstract :
Ion sensitive field effect transistors (ISFETs) built in standard CMOS technology are effectively floating gate devices. They suffer from random trapped charges that alter their threshold voltage (Vt). This paper describes one way to program an ISFET´s floating gate charges in order to bring its Vt to a desirable value using bidirectional electron tunnelling. Two inputs are capacitively coupled to the ISFET´s floating gate via matched capacitors. They are used to indirectly tunnel opposite currents across their oxide isolation to the ISFET´s floating gate in a controlled way. The floating gate charges are programmed using a balanced combination of these two tunnelling currents. Measured experimental results demonstrated programmability and removal of positive and negative trapped charges.
Keywords :
CMOS integrated circuits; biomedical electronics; ion sensitive field effect transistors; tunnelling; voltage control; ISFET´s floating gate charges; ISFET´s threshold voltage control; bidirectional electron tunnelling; built-in standard CMOS technology; ion sensitive field effect transistors; matched capacitors; negative trapped charge removal; opposite current indirect tunneling; oxide isolation; positive trapped charge removal; random trapped charges; tunnelling currents; CMOS integrated circuits; Capacitors; Chemicals; Equations; Logic gates; Threshold voltage; Tunneling;
Conference_Titel :
Biomedical Circuits and Systems Conference (BioCAS), 2012 IEEE
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4673-2291-1
Electronic_ISBN :
978-1-4673-2292-8
DOI :
10.1109/BioCAS.2012.6418469