Title : 
Ball grid array assembly issues in manufacturing
         
        
            Author : 
Rao, Srinivas T.
         
        
            Author_Institution : 
Adv. Technol., Solectron Corp., Milpitas, CA, USA
         
        
        
        
        
            Abstract : 
Ball Grid Array (BGA), Tape Ball Grid Array (TBGA) and other area array surface mount packages offer great advantages to the system designer in terms of performance enhancement as well as possible overall lower costs. From a volume manufacturing (in assembly) perspective there are advantages and drawbacks. Package warp, as well as the hidden interconnects are definite concerns. However there are solutions. The assembly challenges are discussed along with solutions that may be put in place in volume manufacturing. The results of an implemented robust manufacturing process are discussed along with metallurgical cross-sections. X-ray scanning beam laminograph results of good as well bad joints are presented. Results of assembled BGA cards subjected to accelerated reliability tests are also reviewed
         
        
            Keywords : 
fine-pitch technology; integrated circuit packaging; integrated circuit reliability; microassembling; printed circuit manufacture; reflow soldering; surface mount technology; X-ray scanning beam laminograph; accelerated reliability tests; area array surface mount packages; assembly; ball grid array; robust manufacturing process; tape BGA; volume manufacturing; Assembly; Costs; Electronic mail; Electronics packaging; Inspection; Life estimation; Manufacturing processes; Robustness; Silicon; Surface-mount technology;
         
        
        
        
            Conference_Titel : 
Electronics Manufacturing Technology Symposium, 1994. Low-Cost Manufacturing Technologies for Tomorrow's Global Economy. Proceedings 1994 IEMT Symposium., Sixteenth IEEE/CPMT International
         
        
            Conference_Location : 
La Jolla, CA
         
        
            Print_ISBN : 
0-7803-2037-9
         
        
        
            DOI : 
10.1109/IEMT.1994.404730