DocumentCode
3046287
Title
Heavy Ion Test Results For Electronic Devices
Author
LaBel, Kenneth A. ; Crabtree, Christina M. ; Stassinopoulos, E.G. ; Wiseman, Donald ; Moran, Amy K.
Author_Institution
NASA/GSFC
fYear
1993
fDate
34171
Firstpage
27
Lastpage
32
Keywords
BiCMOS integrated circuits; CMOS process; Circuit testing; Condition monitoring; Electronic equipment testing; Ion beams; Laboratories; NASA; Single event upset; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN
0-7803-1906-0
Type
conf
DOI
10.1109/REDW.1993.700564
Filename
700564
Link To Document