DocumentCode :
3046287
Title :
Heavy Ion Test Results For Electronic Devices
Author :
LaBel, Kenneth A. ; Crabtree, Christina M. ; Stassinopoulos, E.G. ; Wiseman, Donald ; Moran, Amy K.
Author_Institution :
NASA/GSFC
fYear :
1993
fDate :
34171
Firstpage :
27
Lastpage :
32
Keywords :
BiCMOS integrated circuits; CMOS process; Circuit testing; Condition monitoring; Electronic equipment testing; Ion beams; Laboratories; NASA; Single event upset; Test facilities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
Type :
conf
DOI :
10.1109/REDW.1993.700564
Filename :
700564
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3046287
