Title :
Heavy Ton / Proton Test Results On High Integrated Memories
Author :
Duzellier, S. ; FaIguere, D. ; Ecoffet, R.
Author_Institution :
CERT/ONERA
Keywords :
Capacitors; Circuits; Density measurement; Manufacturing; Nickel; Protons; Random access memory; Satellites; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700566
