DocumentCode

3046690

Title

Heavy Ton / Proton Test Results On High Integrated Memories

Author

Duzellier, S. ; FaIguere, D. ; Ecoffet, R.

Author_Institution

CERT/ONERA

fYear

1993

fDate

34171

Firstpage

36

Lastpage

42

Keywords

Capacitors; Circuits; Density measurement; Manufacturing; Nickel; Protons; Random access memory; Satellites; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 1993., IEEE

Print_ISBN

0-7803-1906-0

Type

conf

DOI

10.1109/REDW.1993.700566

Filename

700566