Title :
Measurement of single event effects in the 87C51 microcontroller
Author :
Oberg, Dennis L. ; Wert, Jerry L. ; Normand, E. ; Ness, Joseph D. ; Majewski, Peter P. ; Kennerud, R.A.
Author_Institution :
Boeing Defense & Space Group
Keywords :
Aerospace testing; Circuit testing; Counting circuits; Cyclotrons; Microcontrollers; Microprocessors; Particle beams; Protons; Read-write memory; Space stations;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700567
