DocumentCode
3047022
Title
Calibration of registration errors in the sub-aperture stitching testing for aspheric surface
Author
Yu-jing, Qiao ; Jing-wei, Xu
Author_Institution
Sch. of Mech. & Power Eng., Harbin Univ. of Sci. & Technol., Harbin, China
Volume
2
fYear
2012
fDate
18-20 May 2012
Firstpage
984
Lastpage
987
Abstract
In order to restrain the influence of matching error in testing of asphere using sub-aperture stitching method, a stitching algorithm is presented that based on affine transformation and position optimization of sub-aperture, inconsistency of corresponding points in stitching overlap of sub-aperture that caused by registration error are corrected, and improving the accuracy of stitching testing. First, the reason of phase error inconsistency for sub-aperture overlap is analyzed, and according to the principle of overlap phase error minimization, using reverse solution method, coefficients in equation are gotten. The date registration and position optimal correction for sub-aperture is on doing. Experimental result show that after correcting registration error, the stitching testing result of sub-aperture utilizing method of sequence stitching and synchronous stitching are more identical with the direct testing result of whole aperture.
Keywords
affine transforms; calibration; pattern matching; signal processing; affine transformation; asphere testing; aspheric surface; date registration; equation coefficients; matching error; overlap phase error minimization; phase error inconsistency; position optimal correction; registration error calibration; reverse solution method; sequence stitching; stitching algorithm; stitching overlap; subaperture position optimization; subaperture stitching method; subaperture stitching testing; synchronous stitching; Apertures; Distortion measurement; Measurement uncertainty; Optical surface waves; Optimization; Surface waves; Testing; Aspheric surface; Measurement; Registration error; Sequence stitching; Sub-aperture; Synchronous stitching;
fLanguage
English
Publisher
ieee
Conference_Titel
Measurement, Information and Control (MIC), 2012 International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4577-1601-0
Type
conf
DOI
10.1109/MIC.2012.6273441
Filename
6273441
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