• DocumentCode
    3047095
  • Title

    A systematic tuning approach for the use of extended Kalman filters in batch processes

  • Author

    Valappil, Jaleel ; Georgakis, Christos

  • Author_Institution
    Chem. Process Modeling & Control Res. Center, Lehigh Univ., Bethlehem, PA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    2-4 Jun 1999
  • Firstpage
    1143
  • Abstract
    State estimation methods, like the extended Kalman filter (EKF) are used for obtaining reliable estimates of the states from the available measurements in the presence of model uncertainties and unmeasured disturbances. The main open issue in applying EKF is the need to quantify the accuracy of the model in terms of the process noise covariance matrix, Q. The present paper proposes two methods that utilize the parametric model uncertainties to calculate the Q matrix of an EKF. The first approach is based on a Taylor series expansion of the nonlinear equations around the nominal parameter values. The second approach accounts for the nonlinear dependence of the system on the fitted parameters by use of Monte Carlo simulations that are easily be performed online. The value of the process noise covariance matrix (Q) obtained is not limited to a diagonal and constant matrix and is dependent on the current state of the dynamic system. The paper also discusses the application of these techniques to an example process
  • Keywords
    Kalman filters; Monte Carlo methods; batch processing (industrial); covariance matrices; filtering theory; noise; nonlinear equations; process control; state estimation; EKF; Monte Carlo simulations; Taylor series expansion; batch processes; extended Kalman filters; model uncertainties; nominal parameter values; nonlinear dependence; nonlinear equations; parametric model uncertainties; process noise covariance matrix; reliable state estimates; state estimation methods; systematic tuning approach; unmeasured disturbances; Additive noise; Covariance matrix; Noise measurement; Nonlinear systems; Q measurement; State estimation; Statistics; Symmetric matrices; Technological innovation; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1999. Proceedings of the 1999
  • Conference_Location
    San Diego, CA
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-4990-3
  • Type

    conf

  • DOI
    10.1109/ACC.1999.783220
  • Filename
    783220