DocumentCode
3047095
Title
A systematic tuning approach for the use of extended Kalman filters in batch processes
Author
Valappil, Jaleel ; Georgakis, Christos
Author_Institution
Chem. Process Modeling & Control Res. Center, Lehigh Univ., Bethlehem, PA, USA
Volume
2
fYear
1999
fDate
2-4 Jun 1999
Firstpage
1143
Abstract
State estimation methods, like the extended Kalman filter (EKF) are used for obtaining reliable estimates of the states from the available measurements in the presence of model uncertainties and unmeasured disturbances. The main open issue in applying EKF is the need to quantify the accuracy of the model in terms of the process noise covariance matrix, Q. The present paper proposes two methods that utilize the parametric model uncertainties to calculate the Q matrix of an EKF. The first approach is based on a Taylor series expansion of the nonlinear equations around the nominal parameter values. The second approach accounts for the nonlinear dependence of the system on the fitted parameters by use of Monte Carlo simulations that are easily be performed online. The value of the process noise covariance matrix (Q) obtained is not limited to a diagonal and constant matrix and is dependent on the current state of the dynamic system. The paper also discusses the application of these techniques to an example process
Keywords
Kalman filters; Monte Carlo methods; batch processing (industrial); covariance matrices; filtering theory; noise; nonlinear equations; process control; state estimation; EKF; Monte Carlo simulations; Taylor series expansion; batch processes; extended Kalman filters; model uncertainties; nominal parameter values; nonlinear dependence; nonlinear equations; parametric model uncertainties; process noise covariance matrix; reliable state estimates; state estimation methods; systematic tuning approach; unmeasured disturbances; Additive noise; Covariance matrix; Noise measurement; Nonlinear systems; Q measurement; State estimation; Statistics; Symmetric matrices; Technological innovation; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1999. Proceedings of the 1999
Conference_Location
San Diego, CA
ISSN
0743-1619
Print_ISBN
0-7803-4990-3
Type
conf
DOI
10.1109/ACC.1999.783220
Filename
783220
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