DocumentCode :
3047222
Title :
Automatic localization of AC and PC landmarks in T2-weighted MR volumetric neuroimages
Author :
Zhang, Guangcai ; Fu, Yili ; Wang, Shuguo ; Gao, Wenpeng
Author_Institution :
State Key Lab. of Robot. & Syst., Harbin Inst. of Technol., Harbin, China
fYear :
2010
fDate :
20-23 June 2010
Firstpage :
1830
Lastpage :
1834
Abstract :
A novel method is presented for automatic identification of the anterior commissure (AC) and posterior commissure (PC) in T2-weighted MR volumetric images (MRI). AC and PC are two critical landmarks of human brain. It is important to accurately identify them for brain segmentation, registration, functional neurosurgery, human brain mapping, and particularly for the Talairach transformation. The algorithm of identifying them consists of four steps: (1) Identify the corpus callosum and select the region of interest; (2) Identify the fornix and locate the initial AC; (3) Segment part of the third ventricle and locate the initial PC; (4) Refine the positions of AC and PC. The algorithm has been validated quantitatively with 20 T2-weighted MRI data sets. The mean errors of the localization of them were 1.50 mm (AC) and 1.60 mm (PC). It took about 15 seconds for identifying them on P4 3.0 GHz. This fully automatic algorithm is potentially useful in clinic and for research.
Keywords :
biomedical MRI; brain; research and development; AC landmarks; MRI; PC landmarks; T2-weighted MR volumetric neuroimages; Talairach transformation; anterior commissure; automatic localization; brain registration; brain segmentation; corpus callosum; fornix; functional neurosurgery; human brain mapping; posterior commissure; size 1.5 mm; size 1.6 mm; Anatomy; Brain mapping; Humans; Image analysis; Image segmentation; Laboratories; Magnetic resonance imaging; Neurosurgery; Robotics and automation; Shape; Anterior commissure; Corpus callosum; Fornix; Midsagittal plane; Posterior commissure; Third ventricl;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Automation (ICIA), 2010 IEEE International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-5701-4
Type :
conf
DOI :
10.1109/ICINFA.2010.5512224
Filename :
5512224
Link To Document :
بازگشت