Title :
Observations Of Single-event Upset And Multiple-bit Upset In Non-hardened High-density SRAMs In The TOPEX/ Poseidon Orbit
Author :
Underwood, C.I. ; Ecoffet, R. ; Duzeffier, S. ; Faguere, D.
Author_Institution :
Surrey Satellite Technology Ltd.
Keywords :
Computerized monitoring; Manufacturing; Protons; Radiation monitoring; Random access memory; Read-write memory; Satellites; Single event upset; Solid state circuits; Space technology;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700572
