DocumentCode :
3047786
Title :
Analysis of Electron Beam Sensitivity of Self-Assembled Monolayer Resist Depending on Terminal Group
Author :
Kato, K. ; Miyake, Tetsuo ; Beppu, Y. ; Tanii, T. ; Ohdomari
Author_Institution :
Waseda Univ., Tokyo
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
60
Lastpage :
61
Abstract :
Organosilane self-assembled monolayers (SAMs) have been utilized as one of the candidate for electron beam (EB) resist. Hydroxy-terminated SAM is much more sensitive to EB than vinyl-terminated one. This indicates that the sensitivity of SAMs to EB changes significantly depending on their type of terminal groups. However, the reason why the type of the terminal groups makes a difference of EB sensitivity is not understood yet. To clarify this reason, the effect of EB irradiation on SAMs by using infrared spectroscopy (IR), X-ray photoelectron spectroscopy (XPS), ellipsometry and contact angle measurement are discussed.
Keywords :
X-ray photoelectron spectra; contact angle; electron beam effects; electron resists; infrared spectra; monolayers; nanopatterning; organic compounds; self-assembly; X-ray photoelectron spectroscopy; XPS; contact angle measurement; electron beam irradiation; electron beam resist; ellipsometry; infrared spectroscopy; nanopatterning; organosilane self-assembled monolayers; Electron beams; Ellipsometry; Goniometers; Infrared spectra; Laboratories; Materials science and technology; Nanotechnology; Resists; Self-assembly; Silicon compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology, 2007 Digest of papers
Conference_Location :
Kyoto
Print_ISBN :
978-4-9902472-4-9
Type :
conf
DOI :
10.1109/IMNC.2007.4456104
Filename :
4456104
Link To Document :
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