Title :
Demonstration of Secondary Electron Detection using Monolithic Multi-Channel Electron Detector
Author :
Tanimoto, S. ; Pickard, D.S. ; Kenney, C. ; Hasi, J. ; Pease, R.F.W.
Author_Institution :
Hitachi Ltd., Kokubunji
Abstract :
A multi-channel PIN-diode-based detector is developed. The electrodes, in a linear array with pitch of 250 mum, detect the signals generated by the secondary electrons incident into the other side of the detector. Each detection area has a throughhole, which allows the primary beamlet to pass through. The characterizations are performed by using a primary beamlet of a conventional SEM instead of secondary electrons. The experimental results is consistent with the stimulated prediction.
Keywords :
electron detection; lithography; p-i-n diodes; scanning electron microscopy; semiconductor counters; SEM; electrodes; lithography; monolithic multichannel electron detector; multichannel PIN-diode-based detector; primary beamlet; secondary electron detection; Acceleration; Detectors; Electrodes; Electron beams; Laboratories; Magnetic confinement; Magnetic fields; Sensor arrays; Systems biology; Throughput;
Conference_Titel :
Microprocesses and Nanotechnology, 2007 Digest of papers
Conference_Location :
Kyoto
Print_ISBN :
978-4-9902472-4-9
DOI :
10.1109/IMNC.2007.4456110