Title :
Single Event Effects On Space Radiation Hardened 64K SRAMs At Room Temperature
Author :
Kim, Q. ; Schwartz, H. ; McCarty, K. ; Coss, J. ; Barnes, C.
Author_Institution :
California Institute of Technology
Keywords :
Circuit testing; Energy exchange; Ion accelerators; Laboratories; Optical pulses; Radiation hardening; Random access memory; Single event upset; Space technology; Temperature;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700574
