Title :
Total Ionizing Dose Effects In 12-bit Successive-approxmation Analog-to-digital Converters
Author :
Lee, C.I. ; Rax, B.G. ; Johnston, A.H.
Author_Institution :
California Institute of Technology
Keywords :
Analog-digital conversion; BiCMOS integrated circuits; Circuit synthesis; Circuit testing; Costs; Laboratories; Process design; Propulsion; Space technology; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700576
