Title :
Observation Of Single Event Latchup In Bipolar Devices
Author :
Shop, M. ; Gorelick, J. ; Rau, R. ; Kop, Reinier ; Martinez, A.
Author_Institution :
Hughes Space & Communication Company
Keywords :
Aerospace testing; Current supplies; High speed optical techniques; Laboratories; Logic arrays; Logic devices; Logic testing; Particle beam optics; Temperature dependence; Temperature distribution;
Conference_Titel :
Radiation Effects Data Workshop, 1993., IEEE
Print_ISBN :
0-7803-1906-0
DOI :
10.1109/REDW.1993.700577
