DocumentCode
3048839
Title
An on-line testable UART implemented using IFIS
Author
Yeandel, J. ; Thulborn, D. ; Jones, S.
Author_Institution
Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK
fYear
1997
fDate
27 Apr-1 May 1997
Firstpage
344
Lastpage
349
Abstract
This paper presents the design of a complex integrated circuit realised through a novel on-line test methodology. The circuit and its exact conventional equivalent both have been realised in FPGA technology. As such it represents one of the more complex designs realised to date using on-line test approaches. The approach used IFIS (If it Fails It Stops) incorporates dual-rail coding of individual data and a handshaking protocol, which substantially simplifies the detection of failure. Details of the IFIS methodology are given. The IFIS and conventional re-design of a commercial UART are reported, focusing on methodological issues as well as size and speed. Output traces are shown for the IFIS UART on FPGA operating under fault-free conditions and with deliberate failures injected
Keywords
VLSI; automatic testing; data communication equipment; field programmable gate arrays; integrated circuit testing; logic testing; telecommunication equipment testing; FPGA technology; IFIS methodology; complex integrated circuit; dual-rail coding; failure detection; handshaking protocol; online testable UART; Circuit faults; Circuit testing; Costs; Design methodology; Electronic equipment testing; Encoding; Field programmable gate arrays; Integrated circuit technology; Integrated circuit testing; Protocols;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-7810-0
Type
conf
DOI
10.1109/VTEST.1997.600301
Filename
600301
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