• DocumentCode
    3048839
  • Title

    An on-line testable UART implemented using IFIS

  • Author

    Yeandel, J. ; Thulborn, D. ; Jones, S.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK
  • fYear
    1997
  • fDate
    27 Apr-1 May 1997
  • Firstpage
    344
  • Lastpage
    349
  • Abstract
    This paper presents the design of a complex integrated circuit realised through a novel on-line test methodology. The circuit and its exact conventional equivalent both have been realised in FPGA technology. As such it represents one of the more complex designs realised to date using on-line test approaches. The approach used IFIS (If it Fails It Stops) incorporates dual-rail coding of individual data and a handshaking protocol, which substantially simplifies the detection of failure. Details of the IFIS methodology are given. The IFIS and conventional re-design of a commercial UART are reported, focusing on methodological issues as well as size and speed. Output traces are shown for the IFIS UART on FPGA operating under fault-free conditions and with deliberate failures injected
  • Keywords
    VLSI; automatic testing; data communication equipment; field programmable gate arrays; integrated circuit testing; logic testing; telecommunication equipment testing; FPGA technology; IFIS methodology; complex integrated circuit; dual-rail coding; failure detection; handshaking protocol; online testable UART; Circuit faults; Circuit testing; Costs; Design methodology; Electronic equipment testing; Encoding; Field programmable gate arrays; Integrated circuit technology; Integrated circuit testing; Protocols;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.600301
  • Filename
    600301