• DocumentCode
    3049258
  • Title

    A detailed delay path model for FPGAs

  • Author

    Hung, Eddie ; Wilton, Steven J E ; Yu, Haile ; Chau, Thomas C P ; Leong, Philip H W

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    96
  • Lastpage
    103
  • Abstract
    A complete circuit-level description of a representative FPGA is presented in this paper, from which a simple RC delay model as a function of architectural and technology parameters is derived. Using this model, the expression for the optimal delay of any path through the FPGA can be formulated. We distill our model into being purely architecture dependent, and use it to capture new insight into how FPGA parameters can directly affect its delay. Several applications of this model are: (1) to gain better intuition of how architecture and process parameters affect the delay path in an FPGA, (2) for initial studies into new circuit designs and integrated circuit technologies, (3) in CAD tools for optimisation and sensitivity analysis. The technique described can be applied to arbitrary circuits, and simulations show that our closed form equations give delay values that are accurate to approximately 10% when compared to HSPICE simulation.
  • Keywords
    delays; field programmable gate arrays; CAD tools; FPGA; HSPICE simulation; RC delay model; circuit-level description; detailed delay path model; field-programmable gate-arrays; sensitivity analysis; Circuit simulation; Circuit synthesis; Delay; Design automation; Design optimization; Equations; Field programmable gate arrays; Integrated circuit modeling; Integrated circuit technology; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field-Programmable Technology, 2009. FPT 2009. International Conference on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    978-1-4244-4375-8
  • Electronic_ISBN
    978-1-4244-4377-2
  • Type

    conf

  • DOI
    10.1109/FPT.2009.5377673
  • Filename
    5377673