Title :
On adjacent asymmetric error masking (AAEM) codes
Author :
Tallini, L.G. ; Bose, B.
Author_Institution :
Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
fDate :
29 Jun-4 Jul 1997
Abstract :
Matsuzawa and Fujiwara (1988) have proposed a novel scheme to mask line faults of bus line circuits (such as address buses) due to short circuit defects between adjacent lines. We propose the fundamental theory and then present some efficient designs of these codes. Some lower and upper bounds for the optimal codes are also given
Keywords :
codes; fault tolerant computing; system buses; address buses; adjacent asymmetric error masking codes; adjacent lines; bus line circuits; line faults; lower bounds; optimal codes; short circuit defects; upper bounds; Circuit faults; Computer errors; Computer science; Decoding; Random access memory; Read only memory; Read-write memory; Upper bound; Very large scale integration; Virtual manufacturing;
Conference_Titel :
Information Theory. 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Ulm
Print_ISBN :
0-7803-3956-8
DOI :
10.1109/ISIT.1997.613215
