• DocumentCode
    3049898
  • Title

    The risk of data corruption in microprocessor-based systems

  • Author

    Horst, Robert ; Jewett, Doug ; Lenoski, Daniel

  • Author_Institution
    Tandem Comput. Inc., Cupertino, CA, USA
  • fYear
    1993
  • fDate
    22-24 June 1993
  • Firstpage
    576
  • Lastpage
    585
  • Abstract
    Most microprocessor-based systems provide little or no checking for failures of the microprocessor itself. These systems rely on the high reliability of VLSI and the inherent run-time checks (e.g., virtual memory protection and illegal instruction exceptions) to ensure data integrity. The authors present a model for analyzing the vulnerability of systems to undetected data corruptions. The model estimates expected corruption rates based on commercial reliability studies, field experience with fault-tolerant systems, and academic fault-injection studies. They find that without lockstep, an undetected data corruption may occur nearly once per month in a population of 10,000 processors. Given the available data, however, it is difficult to provide tight bounds for the frequency of data integrity violations and the authors´ current estimates of the data corruption rate vary by more than two orders of magnitude. Further study on transient failures and the impact of faults is required to narrow the range of the predictions and reduce the overall risk of undetected data corruptions.
  • Keywords
    data integrity; VLSI; data corruption; data integrity; fault-injection; fault-tolerant systems; illegal instruction exceptions; lockstep; microprocessor-based systems; tight bounds; transient failures; virtual memory protection; Application software; Costs; Fault detection; Fault tolerant systems; Hardware; Microcomputers; Microprocessors; Protection; Runtime; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1993. FTCS-23. Digest of Papers., The Twenty-Third International Symposium on
  • Conference_Location
    Toulouse, France
  • ISSN
    0731-3071
  • Print_ISBN
    0-8186-3680-7
  • Type

    conf

  • DOI
    10.1109/FTCS.1993.627360
  • Filename
    627360