DocumentCode :
3050208
Title :
Various Fatigue Testing of Polysilicon Microcantilever Beam in Bending
Author :
Hocheng, Hong ; Hung, Jeng-Nan
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
356
Lastpage :
357
Abstract :
In this study, the polysilicon microcantilever beams are successfully fabricated and fully suspended. The results of fatigue life in bending are obtained by both microactuator testing method, MTS testing machine and piezoelectric system. The experimental data shows that the larger stress reduces the fatigue life.
Keywords :
bending; cantilevers; fatigue; microactuators; silicon; Si; bending; fatigue life; microactuator testing method; piezoelectric system; polysilicon microcantilever beams; Fatigue; Life testing; Materials testing; Microactuators; Passivation; Piezoelectric films; Silicon; Stress; System testing; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology, 2007 Digest of papers
Conference_Location :
Kyoto
Print_ISBN :
978-4-9902472-4-9
Type :
conf
DOI :
10.1109/IMNC.2007.4456251
Filename :
4456251
Link To Document :
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