DocumentCode
3050650
Title
Partial discharge measurements during the degradation of nanocomposite twisted pair specimens
Author
Guastavino, F. ; Squarcia, S. ; Torello, E.
Author_Institution
Electr. Eng. Dept., Univ. of Genova, Genova, Italy
fYear
2009
fDate
18-21 Oct. 2009
Firstpage
693
Lastpage
696
Abstract
Several electrical aging tests have been carried out on twisted pair specimens prepared by winding wires having conventional or nanostructured enamel insulation. The conventional enamel is polyamide-imide, while the nanostructured enamel is a polyamide imide - silica nanocomposite. The tests have been performed applying sinusoidal voltage at two different frequencies. The partial discharge (PD) signals acquired during the aging tests have been post-processed to define, in the case of the conventional enamel, a reliable parameter useful to implement an empirical prediction model. In this way, after a short PD activity monitoring time, the residual duration of twisted pair specimens can be computed.
Keywords
materials testing; nanocomposites; partial discharge measurement; electrical aging tests; nanocomposite twisted pair specimens; partial discharge measurements; residual duration; Aging; Cable insulation; Degradation; Dielectrics and electrical insulation; Insulation testing; Partial discharge measurement; Partial discharges; Performance evaluation; Silicon compounds; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location
Virginia Beach, VA
ISSN
0084-9162
Print_ISBN
978-1-4244-4557-8
Electronic_ISBN
0084-9162
Type
conf
DOI
10.1109/CEIDP.2009.5377743
Filename
5377743
Link To Document