• DocumentCode
    3050650
  • Title

    Partial discharge measurements during the degradation of nanocomposite twisted pair specimens

  • Author

    Guastavino, F. ; Squarcia, S. ; Torello, E.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Genova, Genova, Italy
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    693
  • Lastpage
    696
  • Abstract
    Several electrical aging tests have been carried out on twisted pair specimens prepared by winding wires having conventional or nanostructured enamel insulation. The conventional enamel is polyamide-imide, while the nanostructured enamel is a polyamide imide - silica nanocomposite. The tests have been performed applying sinusoidal voltage at two different frequencies. The partial discharge (PD) signals acquired during the aging tests have been post-processed to define, in the case of the conventional enamel, a reliable parameter useful to implement an empirical prediction model. In this way, after a short PD activity monitoring time, the residual duration of twisted pair specimens can be computed.
  • Keywords
    materials testing; nanocomposites; partial discharge measurement; electrical aging tests; nanocomposite twisted pair specimens; partial discharge measurements; residual duration; Aging; Cable insulation; Degradation; Dielectrics and electrical insulation; Insulation testing; Partial discharge measurement; Partial discharges; Performance evaluation; Silicon compounds; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
  • Conference_Location
    Virginia Beach, VA
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-4557-8
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2009.5377743
  • Filename
    5377743