DocumentCode :
3050650
Title :
Partial discharge measurements during the degradation of nanocomposite twisted pair specimens
Author :
Guastavino, F. ; Squarcia, S. ; Torello, E.
Author_Institution :
Electr. Eng. Dept., Univ. of Genova, Genova, Italy
fYear :
2009
fDate :
18-21 Oct. 2009
Firstpage :
693
Lastpage :
696
Abstract :
Several electrical aging tests have been carried out on twisted pair specimens prepared by winding wires having conventional or nanostructured enamel insulation. The conventional enamel is polyamide-imide, while the nanostructured enamel is a polyamide imide - silica nanocomposite. The tests have been performed applying sinusoidal voltage at two different frequencies. The partial discharge (PD) signals acquired during the aging tests have been post-processed to define, in the case of the conventional enamel, a reliable parameter useful to implement an empirical prediction model. In this way, after a short PD activity monitoring time, the residual duration of twisted pair specimens can be computed.
Keywords :
materials testing; nanocomposites; partial discharge measurement; electrical aging tests; nanocomposite twisted pair specimens; partial discharge measurements; residual duration; Aging; Cable insulation; Degradation; Dielectrics and electrical insulation; Insulation testing; Partial discharge measurement; Partial discharges; Performance evaluation; Silicon compounds; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location :
Virginia Beach, VA
ISSN :
0084-9162
Print_ISBN :
978-1-4244-4557-8
Electronic_ISBN :
0084-9162
Type :
conf
DOI :
10.1109/CEIDP.2009.5377743
Filename :
5377743
Link To Document :
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