Title :
Electrical properties of silicon oxide/polyimide double layer structures
Author :
Lian, A. ; Martinu, L. ; Klemberg-Sapieha, J.E. ; Wertheimer, M.R.
Author_Institution :
Dept. of Eng., Phys., Ecole Polytech., Montreal, Que., Canada
Abstract :
The bulk and surface DC conductivity of P-SiO2/PI double-layer structures is investigated. The dependence upon temperature, applied electric field, and thermal cycling is studied, and the results are compared to those for bare PI. A model based on ionic (protonic) hopping conduction, affected by a potential barrier and trapping near the P-SiO2/PI interface, is proposed. It is shown to describe the experimental results reasonably well
Keywords :
hopping conduction; ionic conduction in solids; plasma deposited coatings; polymers; protective coatings; silicon compounds; surface conductivity; applied electric field; bulk DC conductivity; double-layer structures; ionic hopping conduction; plasma deposited coatings; potential barrier; protonic hopping conduction; surface DC conductivity; temperature; thermal cycling; trapping; Coatings; Electrodes; Flashover; Plasma temperature; Polyimides; Polymers; Protons; Silicon; Space technology; Thermal conductivity;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
DOI :
10.1109/CEIDP.1990.201336
