Title :
Single frequency characterization of a commercial resin
Author :
Tuncer, Enis ; Sauers, Isidor ; James, D. Randy ; Ellis, Alvin R. ; Polizos, Georgios ; Pace, Marshall O.
Author_Institution :
Oak Ridge Nat. Lab., Oak Ridge, TN, USA
Abstract :
Electrical impedance measurement methods are extensively utilized to characterize dielectric materials. There are not many inexpensive commercially available measurement systems for low frequencies. In this paper an impedance measurement method using an electrometer is presented. The method can be employed for frequencies lower than 100 mHz. To illustrate the usefulness of the presented method, an epoxy resin is characterized and the influence of thermal aging is investigated.
Keywords :
ageing; electric impedance measurement; epoxy insulators; insulator testing; organic insulating materials; resins; commercial resin; electrical impedance measurement; electrometer; epoxy resin; single frequency characterization; thermal aging; Aging; Capacitance; Charge measurement; Current measurement; Dielectric materials; Dielectric measurements; Frequency measurement; Permittivity measurement; Resins; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location :
Virginia Beach, VA
Print_ISBN :
978-1-4244-4557-8
Electronic_ISBN :
0084-9162
DOI :
10.1109/CEIDP.2009.5377751