DocumentCode :
305086
Title :
Study of high-field AC conduction mechanism of electron beam irradiated crosslinked polyethylene film
Author :
Tohyama, K. ; Tokoro, T. ; Mitsumoto, S. ; Nagao, M. ; Kosaki, M.
Author_Institution :
Numazu Coll. of Technol., Japan
Volume :
1
fYear :
1996
fDate :
20-23 Oct 1996
Firstpage :
16
Abstract :
In order to investigate the influence of crosslinking on high field dielectric properties of crosslinked polyethylene, the observations of high-field AC dissipation current waveforms of electron beam (EB) irradiated crosslinked polyethylene (IR-XLPE) films at 90°C were carried out by using the different gel fraction samples. These different gel fraction samples were obtained from a different layer of laminated films of 40 layers from the electron beam irradiation side. From the measurements of capacitance for each IR-XLPE sample, we found that the variations of capacitance with temperature depends on the gel fraction. If the gel fraction is high, then capacitance varies little with temperature and vice versa. From the results of high-field AC dissipation current waveforms under AC ramp voltage application, we have estimated the electric field dependence of tan δ for each gel fraction sample. The results show that the dielectric properties at 90°C depend on the position of film from the electron beam irradiation side. It seems to indicate the mobile carrier in high temperature region are strongly affected not only by the electric field and/or temperature but also by the gel fraction of polyethylene films
Keywords :
XLPE insulation; capacitance; dielectric losses; electrical conductivity; electron beam effects; high field effects; 90 C; AC dissipation current waveform; IR-XLPE; capacitance; crosslinking; dielectric properties; electron beam irradiation; gel fraction; high-field AC conduction; loss angle; polyethylene film; Capacitance; Dielectrics; Educational institutions; Electrodes; Electron beams; Plastic films; Polyethylene; Polymer films; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
Type :
conf
DOI :
10.1109/CEIDP.1996.564575
Filename :
564575
Link To Document :
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