• DocumentCode
    305094
  • Title

    Electrical insulation at cryogenic temperatures

  • Author

    Gordon, L.B. ; Hardy, Tanya ; Origgi, Luz ; Vu, Peter

  • Author_Institution
    Texas Univ., Arlington, TX, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Abstract
    Summary form only given, as follows. In order to reduce the size and mass of portable, high power electrical systems cryogenic cooling is being studied. This allows an increase in efficiency in the generator, high current conductors, and power electronic switches, resulting in smaller conductors, lower resistive losses, and more efficient switching. However, the effects of the low temperatures (ranging possibly from 77 K up to ambient) is not well known for many materials and components. Specifically the effects of cryogenic temperatures on the operational characteristics of capacitors and other dielectrically insulated structures is unknown. Although there may be a decrease in losses there may also be material weakening and material expansion/contraction leading to premature failure or changes in the component characteristics. We have done a survey of relevant previous work in this area and are currently planning some basic tests to determine component characteristics at cryogenic temperature. Preliminary results are presented
  • Keywords
    cooling; cryogenics; dielectric losses; insulation; power electronics; 77 to 293 K; cryogenic cooling; cryogenic temperatures; dielectrically insulated structures; electrical insulation; high power electrical systems; material expansion/contraction; material weakening; power electronic switches; premature failure; resistive losses; Capacitors; Conducting materials; Cryogenics; Dielectric materials; Dielectrics and electrical insulation; Electronics cooling; Power electronics; Power generation; Switches; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564588
  • Filename
    564588