DocumentCode
305104
Title
A novel method for surface charge density measurement
Author
Ping, Zhang ; Kaixi, Zhang
Author_Institution
Dept. of Phys., Hebei Normal Univ., China
Volume
1
fYear
1996
fDate
20-23 Oct 1996
Firstpage
113
Abstract
In this paper, a new method for measuring surface charge density by means of Pockels effect and optic phase compensation is presented. Totally different from current measuring methods, this new measuring probe is made of Pockels crystal and the principle of the measurement is based on optical phase compensation. This problem brings much less disturbance to the surface charge density, especially, one on a conductor surface and the measuring result is easily obtained by readings from a voltmeter
Keywords
Pockels effect; charge measurement; probes; surface charging; Pockels effect; conductor surface; optical phase compensation; probes; surface charge density measurement; Charge measurement; Conductors; Current measurement; Density measurement; Dielectric measurements; Electric variables measurement; Electrostatic measurements; Optical devices; Phase measurement; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location
Millbrae, CA
Print_ISBN
0-7803-3580-5
Type
conf
DOI
10.1109/CEIDP.1996.564609
Filename
564609
Link To Document