DocumentCode :
3051285
Title :
Measurement of electrical surface charge distribution on insulating material by electrooptic Pockels cell
Author :
Kawasaki, T. ; Arai, Y. ; Takada, T.
Author_Institution :
Musashi Inst. of Technol., Tokyo, Japan
fYear :
1990
fDate :
28-31 Oct 1990
Firstpage :
373
Lastpage :
378
Abstract :
The authors have developed a method by which one can obtain the surface charge pattern and density on the BSO (Bi12SiO20 ) crystal surface by means of the electrooptic Pockels effect of the BSO crystal and a video tape recording system. The measurement of electrical charge distribution on an insulator surface and the discrimination of electrical charge polarity using circular polarized incident light and BSO crystal is demonstrated
Keywords :
charge measurement; electro-optical devices; insulation testing; nondestructive testing; BSO crystal; Bi12SiO20; charge density; charge pattern; circular polarized incident light; electrical charge polarity; electrical surface charge distribution; electrooptic Pockels cell; insulating material; measurement; video tape recording system; Birefringence; Charge measurement; Current measurement; Dielectric constant; Dielectrics and electrical insulation; Electric variables measurement; Electrodes; Optical polarization; Optical recording; Optical surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Type :
conf
DOI :
10.1109/CEIDP.1990.201370
Filename :
201370
Link To Document :
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