Title :
A 0.5V 200MHz offset trimmable latch comparator in standard 0.18um CMOS process
Author :
Mohammadi, M. ; Sadeghipour, Khosrov D.
Author_Institution :
Sahand Univ. of Technol., Tabriz, Iran
Abstract :
This paper presents a new high-speed, ultra low-voltage dynamic latch comparator with rail-to-rail input range and an offset trimming technique. Low voltage constraints especially sub-1V applications make the conventional comparator circuits inefficient to operate with high-speed rate. To overcome this issue, a boosting technique has been utilized to increase the overdrive voltage of cross-coupled devices and so speed-up the regeneration phase. The Simulation results for the designed comparator in standard 0.18um CMOS process show that the comparator can detect 200uV input difference at 200MHz frequency while consumes 20.5uW in the latch and 8uW in the offset trimming blocks from a 0.5V supply.
Keywords :
CMOS logic circuits; comparators (circuits); flip-flops; CMOS process; frequency 200 MHz; high-speed dynamic latch comparator; offset trimmable latch comparator; rail-to-rail input range; size 0.18 mum; ultra low-voltage dynamic latch comparator; voltage 0.5 V; CMOS process; Capacitors; Latches; Logic gates; Simulation; Threshold voltage; Transistors; Dynamic comparator; high speed; latch comparator; low voltage; offset trimming; sub volt;
Conference_Titel :
Electrical Engineering (ICEE), 2013 21st Iranian Conference on
Conference_Location :
Mashhad
DOI :
10.1109/IranianCEE.2013.6599863