DocumentCode :
3051317
Title :
Permittivity measurements on molecular-sized samples
Author :
van Roggen, A. ; Yuwono, L. ; Zhou, Hong ; Meijer, P.H.E. ; Kopanski, J.
Author_Institution :
Dept. of Phys., Catholic Univ. of America, Washington, DC, USA
fYear :
1990
fDate :
28-31 Oct 1990
Firstpage :
385
Lastpage :
390
Abstract :
Experimental and instrumental design is described in connection with efforts to make organic bistable devices. One of the research goals is to measure the electrical properties of materials and active devices made with molecular (mainly organic) materials. The size of material samples, and the specimens used for measurement, are exceedingly small, typically layers with a thickness on the order of 100 nm. Preliminary results on polyethylene crystals grown under properly controlled circumstances from solutions of PE in xylene are presented
Keywords :
permittivity; permittivity measurement; polymers; 100 nm; electrical properties; instrumental design; molecular-sized samples; organic bistable devices; polyethylene crystals; xylene; Conducting materials; Dielectric materials; Dielectric measurements; Electrical resistance measurement; Electrodes; Instruments; Laboratories; Organic materials; Permittivity measurement; Physics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Type :
conf
DOI :
10.1109/CEIDP.1990.201372
Filename :
201372
Link To Document :
بازگشت